back to S1S home

Wednesday, July 23, 2008

Working of the solar cell, cont.

As a quick follow up to the previous post on the working of the solar cell let me just point out that for the piece of semiconductor to act as a solar cell three conditions must be met * : (i) semiconductor must feature energy gap (Eg) narrow enough so that it will absorb as much as possible of the impinging solar light, (ii) a potential barrier must be created somewhere within its body so that photogenerated electrons and holes will get separated by the electric field associated with a barrier, and (iii) ohmic contacts must be formed at the two sides of the potential barrier so that electric charges can flow freely in and out of the device.

 

And that's the "working" part of the solar cell story. The rest of it is engineering.... and money.

 

* The rules are somewhat different in the case of solar cells manufactured using organic     semiconductors.

Posted by Jerzy Ruzyllo at 07:13 AM | Semiconductors | Comments (0) | Link


Sunday, July 20, 2008

Working of the solar cell

 In the current solar cell frenzy little attention is being paid to what actually makes semiconductor solar cell work. Specifically, what are the reasons why the illumination of the piece of semiconductor equipped with two terminals generates a difference of potential (voltage) at these two terminals (open circuit voltage).

 
A brief “survey” I recently run shows that the appreciation of the key role solar cell technology is bound to play in semiconductor industry, the general knowledge that it is all about mysterious “photovoltaics”, the recognition of the fact that it is predominantly silicon in either a thin film or a thin wafer form (poly-, multi- or single-crystal) are all there. It is also generally known that it is all about the choice between the manufacturing cost of the cell and its efficiency in converting light into electricity. However, an understanding of what actually does it take for the photons impinging on the semiconductor surface to generate the difference of potential at the device terminals is somewhat hazy. Fortunately, all the information needed to get hold of those fundamentals is just a click away, e.g. solar cell,  [1,2,3] and many others.     

Posted by Jerzy Ruzyllo at 07:38 PM | Semiconductors | Comments (0) | Link


Wednesday, July 16, 2008

A big picture in teaching semiconductors

There is so much going on in semiconductor science and engineering these days and semiconductor technology is becoming such a diversified technical domain that grasping the entire breadth of it is does not seem to be possible.  On the surface organic LEDs on flexible substrates and 45 nm terahertz CMOS circuitry, MEMS actuators and quantum nanodot devices, power MOSFETs and III-V superlattices, do not have much in common.  

 

Such a segmentation of thinking about semiconductor science and technology should not be allowed into the  teaching of semiconductors at the undergraduate level. Isn’t it that the principles of the field effect are the same in advanced Si CMOS gates, organic TFTs, power UMOSFETs, nanowire transistors, and so on? The concept of carrier mobility cuts across all semiconductor materials and devices? Fundamentals of the ohmic contact are the same regardless of the function of the device and semiconductor used? And it's regardless of whether “micro” or “nano” is the prefix of the day? The principles of key processing steps such as pattern definition or film deposition via CVD, PVD, ALD, etc., are independent of the type of device and material?  Or,… well, you’ve got the point…

 

I strongly believe that it is very important that while teaching semiconductors we emphasize those commonalities, we stress fundamentals, and do not paint a picture in which processing of 32 nm Si CMOS circuitry and Si solar cells, for instance, have nothing in common and represents two entirely different technical domains. Keeping in mind fundamentals we will end up educating future engineers and scientists who will be able to see a proverbial "big picture". No real breakthroughs can be accomplished without it.

Posted by Jerzy Ruzyllo at 08:13 PM | Semiconductors | Comments (0) | Link


Sunday, June 22, 2008

From smoke signals to CMOS

Our ability to process and transmit an information is all dependent upon devices and information carrying medium which can be turned "on" and "off" fast enough so that corresponding sequence of "1"s and "0"s can be executed billions of times per second. The search for this perfect switch goes on forever and is among key forces driving  our progress.

 

The good news for us, semiconductor buffs, is that for the last fifty years, or so, it is based entirely on the advances in semiconductor technology. For now, it is a flow of electrons and a CMOS cell.... But the need to transmit an information  was always there.  Not  that long ago it was a smoke and  the blanket operated by a skillful warrier. Then, the electric current turned on and off according to the Morse code, etc., etc. What will it be in the future? Well, that's what we are trying to figure out. The good news one more time: whatever media and devices we will come up with, we can rest assured that semiconductors will be somehow invloved.

Posted by Jerzy Ruzyllo at 08:25 AM | Semiconductors | Comments (1) | Link


Monday, June 16, 2008

More on tunneling

More on the tunneling, this time in the upbeat tone. As both horizontal and vertical geometries of semiconductor devices continue to shrink and the demand regarding device functionality increases, the role of quantum tunneling in the next generation semiconductor devices can only grow. This is very this very important conduction mechanism is getting our very serious attention now. 

The role of tunneling as a "spoiler" in high density CMOS technology will be pushed to the background. This is because recently introduced into production (45 nm technology node) high-k gate dielectrics will allow an increase of the physical thickness of the gate dielectric. This in turn will decrease significantly probability of electron tunneling across the gate dielectric, and hence, will decrease leakage current.
 
By the way, in the case some of you are not aware of it. Long, long before parasitic tunneling current in MOS gates has become an issue, a significant research effort aimed at the development of the functional MOS tunnel devices was carried out. Those were very unusual MOS devices as  the role of the oxide was not to bloc current off, but to create a diode-like device featuring unique characteristics. Characteristics which on one hand were different from those of MS devices (Schottky diodes) and on the other, from MOS capacitors. At that time typical thickness of the gate oxide in standard MOS devices was about 40 nm. Hence, the research on 3 nm MOS oxides was not exactly a mainstream effort. Back then we didn’t even consider the possibility that the gate oxide thickness in MOS ICs would ever, ever get down to the today’s level of 1 nm or so (we thought it was virtually impossible because of .... yes, tunneling).
 
In any case, I don’t think that younger members of the MOS community realize how serious was the work on the effect of tunneling in MOS structures (direct, resonant, Fowler-Nordheim...) done some 30 years ago. I myself was involved in it for quite sometime (my focus was on the growth of what was called a "tunnel oxide") and even produced a paper or two in this area, e.g. “Lateral MIS Tunnel Transistor”, IEEE Electron Dev. Lett., EDL-1,197 (1980). Just keep in mind in the case you will come across it - it was written almost 30 years ago.

Posted by Jerzy Ruzyllo at 07:14 AM | Semiconductors | Comments (0) | Link


Tuesday, June 10, 2008

Problems with tunneling…

The tunneling is a very important physical phenomenon – it allows a charge carrier to move across the potential barrier without changing energy. It is an "elegant" physical phenomenon, if I may use such a non-scientific terminology.  And a clear cut one - the potential barrier is adequately narrow, tunneling will occur; the barrier gets wider, probability of direct tunneling goes down exponentially.

Several semiconductor devices displaying unique electronic properties, including those based on quantum wells, as well as various memory devices, involve electron tunneling effect.  Yet, in recent years, in cutting edge CMOS technology, tunneling is getting a bad name and is considered a highly undesirable, parasitic effect. This is because the physical thickness of the gate oxide (SiO2) in the most advanced MOS gates ended up being reduced to the limit of about 1 nm. At such a negligible width of the potential barrier the direct tunneling of electrons across the gate oxide is the main reason for an excessive leakage current which ruins the performance of the MOS gate stacks.

 
Next time, let me continue with more optimistic assessment of the role of tunneling in the modern semiconductor device engineering.

Posted by Jerzy Ruzyllo at 09:13 PM | Semiconductors | Comments (0) | Link


Friday, June 6, 2008

The case of silicides

Continuing on the topic of materials in IC technology the case of silicides is an interesting one. This is because transition from one type of silicide to another takes place relatively fast by semiconductor industry standards. Not long ago is was titanium silicide, TiSi2, then cobalt silicide, CoSi2, then nickle silicide NiSi (see the comparison between these three). Now we are talking NiSi with Pt added and in the near future erbium and iridium silicides for instance may take over as lead silicides for ohmic contacts.
 
Well, things are relatively easy when improvement can be accomplished by replacing just one element in the otherwise established process.

Posted by Jerzy Ruzyllo at 09:36 PM | Semiconductors | Comments (0) | Link


Saturday, May 31, 2008

It's (almost) all about the materials

Any replacement of one material with another in mass IC production is a very costly and a very disruptive process. Hence, any such step is delayed as much as possible and is implemented only if no other solution assuring an improvement in circuit performance is available. For instance, it was not until interconnect technology was push hard against the red wall that the switch from Al to Cu was reluctantly implemented. The same applies to the recently announced switch in MOS gate technology from SiO2-based to high-k gate dielectrics.

 
It is interesting to see how the semiconductor industry succeeds in delaying any such major change with incremental changes in material composition. For instance, addition of nitrogen to SiO2 extended usefulness of this last as a gate dielectric in advanced CMOS over quite a few technology nodes. Similarly, addition of fluorine to SiO2 saved it temporarily at the opposite end of the dielectric constant spectrum (fluorine reduces dielectric constant of SiO2 used as an interlayer dielectric). Also, serious attempts were made throughout the years to “save” very easy to deposit and etch Al in advanced IC technology. In contact applications addition of Si was used to curtail Al ability to spike the junction while in the interconnect applications barrier metals were used to slow down electromigration of Al. More recently, addition of Pt is helping a  “star” silicide NiSi to cope with its limitations.
 
Well, you’ve got the idea…. It all comes down to materials science and engineering being a critically important element of semiconductor device technology.

Posted by Jerzy Ruzyllo at 09:06 PM | Semiconductors | Comments (0) | Link


Thursday, May 22, 2008

ECS meetings, cont.

One of the reason I enjoy ECS meetings is a diversity of topics covered by some thirty or so symposia held during the four days long gatherings. While focusing on one or two "semiconductor symposia" I always find time to check on what's going on in the research areas to which I normally don't have much of an exposure. It's kind of fun to wonder into the room and listedn to the talk on electrochemical biosensors or fullerenes and carbon nanotubes or biological fuel cells or.....

By the way, the next ECS meeting will take place in mid-October 2008 in Honolulu, Hawaii. There will be 15 semiconductor related symposia held during this particular meeting. If interested in submitting an abstract you must hurry as the deadline for the abstract submission is May. 30.

Posted by Jerzy Ruzyllo at 08:19 AM | Semiconductors | Comments (0) | Link


Monday, May 19, 2008

The 213th ECS meeting

Greetings from Phoenix, Arizona. That's where the 213th biannual meeting of the Electrochemical Society is taking place. The ECS, defining itself as the Society for Solid-State and Electrochemical Science and Technology, was born in 1902 and continues to be among the prime science and technology related societies in the world. I am a member of ECS for over 20 years and, because of the traditionally very strong semiconductor component in the ECS's fabric, I draw much from this association.

 

Just to get a feel for what's going on during the ECS meeting in Phoenix you may want to take a look at the today's plenary session talks as well as at the semiconductor related symposia held during this meeting.

Posted by Jerzy Ruzyllo at 11:49 PM | Semiconductors | Comments (0) | Link


››


Jerzy Ruzyllo is a Professor of Electrical Engineering and Materials Science and Engineering at Penn State and in his spare time he likes to blog about semiconductors.


‹‹ July 2008 ››
W Mo Tu We Th Fr Sa Su
27 1 2 3 4 5 6
28 7 8 9 10 11 12 13
29 14 15 16 17 18 19 20
30 21 22 23 24 25 26 27
31 28 29 30 31      





Recent posts
Working of the solar cell, cont.
Working of the solar cell
A big picture in teaching semiconductors
From smoke signals to CMOS
More on tunneling
Problems with tunneling…
The case of silicides
It's (almost) all about the materials
ECS meetings, cont.
The 213th ECS meeting


Categories
Semiconductors





Copyright © 2008 J. Ruzyllo. All rights reserved.